Dr. Patrice Salzenstein
Dr. Patrice Salzenstein

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Dr. Patrice SALZENSTEIN

Senior researcher

Centre National de la Recherche Scientifique (CNRS)

Université de Bourgogne Franche-Comté (UBFC), France


Speech title:Design and characterization of optoelectronic oscillators and optical resonators

Abstract: Optoelectronic oscillators represent a field of investigation that needs to be better defined. It is first necessary to build such oscillators from different elements. Then we must in particular being able to evaluate the performance in terms of phase noise of such oscillators. These oscillators can involve optical delay lines or optical resonators whose performance must be evaluated and which must be characterized. Here we present principles, then concrete examples with results.


Biography

Dr. Patrice Salzenstein, Post-Graduate Engineering school degree (Lille, Eudil'93) and Ph. D in Electronics, University of Sciences and Technologies of Lille (USTL'96), worked between 1996 and 2001 near Paris, France, at Thomson CSF LCR (now THALES-TRT), Alcatel Alsthom Recherche (now NOKIA), LCIE private research laboratories. He managed a calibration laboratory (phase noise and short-term stability of frequency) between 2002 and the beginning of 2012. He has been working since 2001 for CNRS, a government-funded research organization under administrative authority of France's Ministry of research, at FEMTO-ST institute in Besancon, in Electronic Engineering domain. In 2010, one of his articles was featured in Electronics Letters for his participation with Czech and Swiss colleagues to the best frequency stability ever measured on a quartz crystal oscillator: 2.5×10-14 at 5 MHz. Between 2010 and 2017, his fields of interest in research were for optoelectronic resonators and oscillators for microwaves photonics applications. He is now with the Micro nano Science & Systems department of CNRS UMR 6174 FEMTO-ST laboratory. His current interest is in Brillouin Scattering Stimulation. He authored or co-authored more than 90 articles in peer review journals and international conferences.